We have access to the following equipment through the Characterization facility!

Other SEMs Details can be found here!


FEI Helios NanoLab G4 dual-beam focused ion beam

Location: 75 Shepherd Labs


  • Installed in the vibrationally isolated High Resolution Microscopy Center (HRMC).
  • Provides fast, accurate, and precise milling and deposition of complex structures with critical dimensions of less than 10 nm.
  • Ultimate SEM imaging resolution approaches 0.6 nm.

More detailed information is available at the vendor web site: www.fei.com/products/dualbeam/helios-nanolab/


JEOL 6500 Field Emission Gun

Location:  74 Shepherd Labs


  • High resolution secondary electron imaging; backscatter electron imaging; energy dispersive spectroscopy; electron backscatter diffraction; and cathodoluminescence
  • Thermally-assisted field-emission gun
  • Accelerating voltage from 0.5 to 30 kV
  • Lateral resolution of 1.5 nm
  • Magnification ranges from 10 X to 400,000X
  • Sample size: 50 x 125 x 125 mm
  • Backscattered imaging at TV rates and low voltage using the Centaurus detector
  • Chemical analysis of bulk samples with elements as low as sodium available using a Thermo-Noran Vantage system
  • Cathodoluminescence analysis with a Gatan (Oxford) MonoCL 2 system
  • Crystallographic analysis with an EBSD system from HKL allowing pattern indexing and texture mapping with Channel 5 software