We have access to the following equipment through the Characterization facility!
Other SEMs Details can be found here!
FEI Helios NanoLab G4 dual-beam focused ion beam
Location: 75 Shepherd Labs
Specifications:
- Installed in the vibrationally isolated High Resolution Microscopy Center (HRMC).
- Provides fast, accurate, and precise milling and deposition of complex structures with critical dimensions of less than 10 nm.
- Ultimate SEM imaging resolution approaches 0.6 nm.
More detailed information is available at the vendor web site: www.fei.com/products/dualbeam/helios-nanolab/
Thermo Apreo 2S Lo-Vac
Location: 74 Shepherd Labs
Specifications:
- High resolution secondary electron imaging; backscatter electron imaging; energy dispersive spectroscopy; electron backscatter diffraction; and cathodoluminescence
- <1nm resolution at the optimum working distance and ~1nm resolution at the analytical working distance
- Stage can hold up to 18 regular SEM stubs
- 5-axis motorized eucentric stage, 110 x 110 mm2 with a 105° tilt range. Maximum sample weight: 5 kg in un-tilted position.
- Lo-Vac feature enables the pressure to be raised up to 500Pa for charge suppression of non-conductive materials
- Magnification ranges from 10 X to 400,000X
- EDS using Oxford Instruments Ultimax 100mm2 with Aztec Live chemical imaging
- Crystallographic analysis with an EBSD system from Oxford allowing pattern indexing and texture mapping with Channel 5 software at 5000 patterns per second